Nanojehm Upcoming Events: 

**Visit us all week at Angstrom Scientific's Booth #1210**

Learn more about Nanojehm and Computational Microscopy and how we apply it to SEM image restoration to improve quality and productivity, hosted at 
Tescan's Booth #1508 for a free Lunch and Learn at 12:00pm on Tuesday August 8, presented by Nanojehm's Matt Zotta 
This talk will describe how computational software can be used to improve the resolution and quality of scanning electron microscope images. The process involves calculating the Point Spread Function (PSF) of an SEM and utilizing it along with advanced algorithms to restore an SEM image to what best describes the details of the original object. This talk will discuss the benefits of computational microscopy and will include a demonstration of the restoration process.

Wednesday 10:45am, 11:00am will be two back to back Nanojehm presentation for the Analytical Sciences Symoposia 

10:45 AM 607 Scanning Electron Microscope Point Spread Function Determination Through the Use of Particle Dispersions; MD Zotta, E Lifshin; SUNY Polytechnic Institute

11:00 AM 608 Viability of Point Spread Function Deconvolution for SEM; MC Nevins; Rochester Institute of Technology; MD Zotta; Nanojehm; RK Hailstone; Rochester Institute of Technology; E Lifshin

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Nanojehm Past Events: 

March 8th & 9th 2017 
Nanojehm is at NIST Electron Microscopy Frontiers: Opportunities and Challenges

Professor Eric Lifshin & CTO of Nanojehm, will be presenting on 3/8 in the afternoon
Seminar name: Improving the Resolution, Acquisition Time and Quality of Scanning Microscopy Images Through Computational Rather Than Hardware Means

Nanojehm was at the fall MRS meeting. 

  Thank you to everyone who stopped by the booth at M&M.